Open AccessTHE RESEARCH OF THE RELIABILITY OF ELECTRONIC PRODUCTS UNDER THE INFLUENCE OF IONIZING RADIATION
Author(s) -
Anton S. Ishkov,
А. С. Петров,
G. A. Solodimova,
D. V. Egorov
Publication year - 2020
Publication title -
izmerenie, monitoring, upravlenie, kontrolʹ
Language(s) - English
Resource type - Journals
ISSN - 2307-5538
DOI - 10.21685/2307-5538-2020-1-5
Subject(s) - ionizing radiation , reliability (semiconductor) , reliability engineering , radiation , biochemical engineering , computer science , engineering , irradiation , physics , nuclear physics , power (physics) , quantum mechanics