Open AccessMARKOV MODEL FOR PREDICTING THE PARAMETRIC RELIABILITY OF ELECTRONIC SYSTEMS
Author(s) -
А. К. Grishko
Publication year - 2019
Publication title -
izmerenie, monitoring, upravlenie, kontrolʹ
Language(s) - English
Resource type - Journals
ISSN - 2307-5538
DOI - 10.21685/2307-5538-2019-2-1
Subject(s) - reliability engineering , reliability (semiconductor) , computer science , parametric statistics , markov chain , markov model , machine learning , engineering , statistics , mathematics , physics , power (physics) , quantum mechanics