Open AccessANALYSIS OF OPPORTUNITIES TO REDUCE THE AMOUNT OF RELIABILITY TESTS
Author(s) -
N. К. Yurkov,
В. С. Михайлов
Publication year - 2019
Publication title -
nadežnostʹ i kačestvo složnyh sistem
Language(s) - English
Resource type - Journals
ISSN - 2307-4205
DOI - 10.21685/2307-4205-2019-4-17
Subject(s) - reliability engineering , reliability (semiconductor) , computer science , engineering , physics , thermodynamics , power (physics)