Open AccessTHE CHOICE OF THE ELECTRICAL PARAMETERS OF INTEGRATED CIRCUIT SPECIAL PURPOSE FOR THE INDIVIDUAL FORECASTING OF QUALITY AND RELIABILITY
Author(s) -
Roman O. Mishanov,
Михаил Николаевич Пиганов,
В. П. Перевертов
Publication year - 2018
Publication title -
nadežnostʹ i kačestvo složnyh sistem
Language(s) - English
Resource type - Journals
ISSN - 2307-4205
DOI - 10.21685/2307-4205-2018-2-6
Subject(s) - reliability (semiconductor) , reliability engineering , quality (philosophy) , computer science , engineering , power (physics) , philosophy , physics , epistemology , quantum mechanics