Open AccessA SEMANTIC ANALYSIS OF PERSPECTIVE MICRO- AND NANOELECTRONICS IN TERMS OF KEY INDICATORS’ INCREASE IN QUALITY AND WORKABILITY
Author(s) -
A. P. Adamov,
A. A. Adamova
Publication year - 2017
Publication title -
nadežnostʹ i kačestvo složnyh sistem
Language(s) - English
Resource type - Journals
ISSN - 2307-4205
DOI - 10.21685/2307-4205-2017-3-14
Subject(s) - nanoelectronics , perspective (graphical) , key (lock) , quality (philosophy) , computer science , nanotechnology , materials science , physics , artificial intelligence , computer security , quantum mechanics