Open AccessMODELING OF DATA STORAGE RELIABILITY IN DYNAMIC MEMORY MICROCIRCUITS IN MATLAB/SIMULINK ENVIRONMENT
Author(s) -
К. И. Хомутов,
A. A. Shegal,
A. A. Iofin,
В. Е. Иванов
Publication year - 2017
Publication title -
nadežnostʹ i kačestvo složnyh sistem
Language(s) - English
Resource type - Journals
ISSN - 2307-4205
DOI - 10.21685/2307-4205-2017-3-11
Subject(s) - reliability (semiconductor) , computer science , matlab , reliability engineering , embedded system , computer hardware , operating system , engineering , physics , power (physics) , quantum mechanics