Open AccessCAUSE AND EFFECT APPROACH TO RELIABILITY MODELING OF "GAS PHASE – SEMICONDUCTOR" SYSTEM
Author(s) -
A. I. Belozertsev,
С. З. Эль-Салим
Publication year - 2017
Publication title -
nadežnostʹ i kačestvo složnyh sistem
Language(s) - English
Resource type - Journals
ISSN - 2307-4205
DOI - 10.21685/2307-4205-2017-3-1
Subject(s) - reliability (semiconductor) , reliability engineering , phase (matter) , semiconductor , gas phase , materials science , environmental science , computer science , engineering , optoelectronics , chemistry , thermodynamics , physics , power (physics) , organic chemistry