Open AccessON SINGLE DIAGNOSTIC TESTS FOR LOGIC CIRCUITS IN THE ZHEGALKIN BASIS
Author(s) -
Кирилл Андреевич Попков
Publication year - 2016
Publication title -
izvestiâ vysših učebnyh zavedenij. povolžskij region. fiziko-matematičeskie nauki
Language(s) - English
Resource type - Journals
ISSN - 2072-3040
DOI - 10.21685/2072-3040-2016-3-1
Subject(s) - computer science , basis (linear algebra) , electronic circuit , reliability engineering , engineering , electrical engineering , mathematics , geometry