Open AccessMethods of Dynamic Critical Path Monitoring for Better Performance and Power Efficiency in VLSI-Circuits
Author(s) -
Ilya Peplov,
Leonid Eisymont
Publication year - 2019
Publication title -
voprosy kiberbezopasnosti
Language(s) - English
Resource type - Journals
ISSN - 2311-3456
DOI - 10.21681/2311-3456-2019-4-35-45
Subject(s) - critical path method , very large scale integration , path (computing) , power (physics) , computer science , electronic circuit , electronic engineering , reliability engineering , embedded system , engineering , electrical engineering , computer network , physics , systems engineering , quantum mechanics