Open AccessEffect of unsharpness on the result of thermovision diagnostics of electronic components
Author(s) -
Krzysztof Dziarski,
Arkadiusz Hulewicz
Publication year - 2020
Publication title -
proceedings of the 2010 international conference on quantitative infrared thermography
Language(s) - English
Resource type - Conference proceedings
DOI - 10.21611/qirt.2020.159
Subject(s) - materials science , temperature measurement , optics , infrared , lens (geology) , bandwidth (computing) , acoustics , engineering , physics , telecommunications , quantum mechanics
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