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Exploratory Factor Analysis of Infrared Thermographic Data for Defect Detection
Author(s) -
Kai-Lun Huang,
Стефано Сфарра,
Yuan Yao
Publication year - 2020
Publication title -
proceedings of the 2010 international conference on quantitative infrared thermography
Language(s) - English
Resource type - Conference proceedings
DOI - 10.21611/qirt.2020.004
Subject(s) - infrared , thermography , computer science , materials science , optics , physics

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