Open AccessNew approach for layer thickness measurements using pulsed lock-in thermography
Author(s) -
D. Hoffmann,
T. Hochrein,
M. Bastian,
G. Schober
Publication year - 2019
Language(s) - English
Resource type - Conference proceedings
DOI - 10.21611/qirt.2019.001
Subject(s) - thermography , lock (firearm) , materials science , layer (electronics) , computer science , acoustics , optics , composite material , engineering , mechanical engineering , infrared , physics