Open AccessPulsed thermography in the investigation of PCBs for defect detection & analysis
Author(s) -
Nicolas P. Avdelidis,
P. Ian Nicholson,
Paul A. W. Wallace
Publication year - 2006
Publication title -
proceedings of the 2010 international conference on quantitative infrared thermography
Language(s) - English
Resource type - Conference proceedings
DOI - 10.21611/qirt.2006.048
Subject(s) - thermography , materials science , computer science , remote sensing , environmental science , geology , optics , physics , infrared
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