Open AccessThe Effect of Measurement Frequency on Dielectric Characteristics in Al/P-Si Structures with Interfacial Native Oxide Layer
Author(s) -
Mehmet Can Özdemir,
Ömer Sevgili,
İkram Orak,
A. Türüt
Publication year - 2020
Publication title -
iğdır üniversitesi fen bilimleri enstitüsü dergisi (online)
Language(s) - English
Resource type - Journals
ISSN - 2536-4618
DOI - 10.21597/jist.612518
Subject(s) - oxide , physics , materials science , analytical chemistry (journal) , chemistry , metallurgy , chromatography