Open AccessMODELLING OF X-RAY DIFFRACTION BY CARBON NANOSTRUCTURES AND DETERMINATION OF THEIR POSSIBLE TOPOLOGICAL CONTENTS IN THE DEPOSITED FILMS FROM TOKAMAK Т-10
Author(s) -
V. S. Neverov,
A. B. Kukushkin,
N.L. Marusov,
I. Semenov,
Vladimir V. Voloshinov,
Alexander Afanasiev,
Alexey S. Tarasov,
А. А. Велигжанин,
Ya. V. Zubavichus,
N. Yu. Svechnikov,
V. G. Stankevich
Publication year - 2010
Publication title -
voprosy atomnoj nauki i tehniki. seriâ, termoâdernyj sintez
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.343
H-Index - 7
ISSN - 0202-3822
DOI - 10.21517/0202-3822-2010-33-1-7-22
Subject(s) - tokamak , diffraction , nanostructure , materials science , carbon fibers , topology (electrical circuits) , x ray crystallography , nanotechnology , optics , physics , plasma , nuclear physics , electrical engineering , composite material , engineering , composite number