Open AccessRelating Microstructure to Defect Behavior in AA6061 Using a Combined Computational and Multiscale Electron Microscopy Approach
Author(s) -
Yung Suk Jeremy Yoo,
Hojun Lim,
John M Emery,
Josh Kacher
Publication year - 2019
Publication title -
ssrn electronic journal
Language(s) - English
Resource type - Journals
ISSN - 1556-5068
DOI - 10.2139/ssrn.3358892
Subject(s) - microstructure , materials science , electron microscope , microscopy , crystallography , metallurgy , chemistry , physics , optics
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