Open Access§7.7 Reliability Standard (Daubert, Frye)
Author(s) -
Christopher B. Mueller,
Laird C. Kirkpatrick,
Liesa Richter
Publication year - 2018
Publication title -
ssrn electronic journal
Language(s) - Uncategorized
Resource type - Journals
ISSN - 1556-5068
DOI - 10.2139/ssrn.3277067
Subject(s) - reliability (semiconductor) , psychology , reliability engineering , environmental science , engineering , physics , thermodynamics , power (physics)
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