Open AccessDifferences in the Reliability of Fair Value Hierarchy Measurements: A Cross-Country Study
Author(s) -
Chu Yeong Lim,
Jeffrey Ng,
Gary Pan,
Kevin Ow Yong
Publication year - 2016
Publication title -
ssrn electronic journal
Language(s) - English
Resource type - Journals
ISSN - 1556-5068
DOI - 10.2139/ssrn.2824124
Subject(s) - reliability (semiconductor) , value (mathematics) , cross country , statistics , hierarchy , econometrics , mathematics , economics , demographic economics , physics , thermodynamics , market economy , power (physics)
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom