Open AccessPatent Citation Indicators: One Size Fits All?
Author(s) -
Jurriën Bakker,
Dennis Verhoeven,
Lin Zhang,
Bart Van Looy
Publication year - 2016
Publication title -
ssrn electronic journal
Language(s) - English
Resource type - Journals
ISSN - 1556-5068
DOI - 10.2139/ssrn.2810962
Subject(s) - citation , econometrics , statistics , computer science , mathematics , library science
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