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Organic carbon at soil particle surfaces—evidence from x‐ray photoelectron spectroscopy and surface abrasion
Author(s) -
Amelung Wulf,
Kaiser Klaus,
Kammerer Gerd,
Sauer Gustav
Publication year - 2002
Publication title -
soil science society of america journal
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.836
H-Index - 168
eISSN - 1435-0661
pISSN - 0361-5995
DOI - 10.2136/sssaj2002.1526
Subject(s) - x ray photoelectron spectroscopy , carbon fibers , soil water , abrasion (mechanical) , organic matter , particle (ecology) , analytical chemistry (journal) , total organic carbon , soil test , materials science , soil organic matter , chemistry , environmental chemistry , chemical engineering , soil science , environmental science , geology , composite material , oceanography , organic chemistry , composite number , engineering
This study aimed at investigating the potential of x‐ray photoelectron spectroscopy (XPS) for investigating soil organic matter at secondary soil particles. The XPS was applied to microaggregates of the A horizon of a Typic Haplustoll (<20‐μm equivalent diameter, >53‐μm maximum real diameter) and to the fine‐earth fraction (<2 mm) of the Bs horizon of a Typic Haplorthod. Carbon and N, as well as Si (both samples), Ca (Haplustoll), and Al (Haplorthod) were detected. Removing the particle surface layer (<50 nm) by bombarding with Ar + resulted in a strong reduction of the signals of C and N, while those attributed to inorganic components increased relatively. Consequently, in both soils, organic matter was concentrated at the surface of soil aggregates. We conclude that Ar + sputtering followed by XPS analysis is a useful tool in identifying the accumulation of elements at the surfaces of soil particles.