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Photometric Interpretation of X‐Ray Diffraction Patterns for Quantitative Estimation of Minerals in Clays
Author(s) -
Hellman N. N.,
Jackson M. L.
Publication year - 1944
Publication title -
soil science society of america journal
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.836
H-Index - 168
eISSN - 1435-0661
pISSN - 0361-5995
DOI - 10.2136/sssaj1944.036159950008000c0024x
Subject(s) - citation , interpretation (philosophy) , library science , soil water , computer science , geology , soil science , programming language
IN X-ray diffraction analysis by the powder method, constituent minerals are identified by the presence of lines which they alone give in an X-ray diffraction pattern, and their amounts are estimated from the intensity of these lines. Before proceeding with an X-ray analysis of clays, it is necessary to condition the clays so that the critical lines in the X-ray diffraction patterns obtained are, first, distinctive and constant in position, and second, reproducible and maximum in intensity. A procedure of clay preparation which is especially adapted. to these requirements, particularly for montmorillonite and hydrous mica bearing clays, has been reported (i, 2, g, 13). In the present paper, a special photometric procedure is described for measurement and interpretation of X-ray diffraction line intensities, which permits much more precise quantitative estimation of minerals in clays than was formerly possible.