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Biotic Stress and Yield Loss.: Edited by R.K.D. PATTERSON and L.G. HIGLEY. CRC Press LLC, 2000 N.W. Corporate Blvd., Boca Raton, FL 33431. 2001. Hardback, 261 pp., $89.95. ISBN 0‐8493‐1145‐4
Author(s) -
Herbert D. Ames
Publication year - 2002
Publication title -
crop science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.76
H-Index - 147
eISSN - 1435-0653
pISSN - 0011-183X
DOI - 10.2135/cropsci2002.6560
Subject(s) - virginia tech , library science , art , computer science