z-logo
Premium
Variation in Soft Winter Wheat Characteristics Measured by the Single Kernel Characterization System
Author(s) -
Hazen S. P.,
Ward R. W.
Publication year - 1997
Publication title -
crop science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.76
H-Index - 147
eISSN - 1435-0653
pISSN - 0011-183X
DOI - 10.2135/cropsci1997.0011183x003700040008x
Subject(s) - cultivar , kernel (algebra) , gene–environment interaction , biology , nonparametric statistics , mathematics , agronomy , statistic , horticulture , statistics , genotype , biochemistry , combinatorics , gene
Kernel hardness is one of the key grain attributes considered in wheat ( Triticum aestivum L.) marketing in the USA. The objective of this research was to characterize the effects of cultivar, environment, and cultivar × environment interaction on kernel hardness as measured by the Single Kernel Characterization System. Kernel weight and width were also studied. Eleven soft winter wheat cultivars were grown in replicated trials in 19 environments in Michigan. All three traits were significantly ( P < 0.01) affected by cultivar, environment, and cultivar × environmentin teraction. Variation for kernel hardness was large and continuous among cultivars and environments. Hhün's nonparametric stability statistic showedt hat there were no differences in ranks tability of the cultivars. Principal componenatn alysis of the cultivar × environment interaction effects showed that there were no consistent patterns of behavior for similar cultivars, locations, or seasons. The only significant and large correlation was kernel weight vs. kernel width ( r = 0.89). These data suggest that one environment of testing or a composite sample of multiple environments may be sufficient to accurately rank cultivars for kernel hardness. The large magnitude of the environmental effects will make prediction of hardness of a given wheat crop difficult even when the cultivar is known.

This content is not available in your region!

Continue researching here.

Having issues? You can contact us here