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Modified Early Generation Testing Procedure for Yield Selection in Soybean
Author(s) -
Cooper Richard L.
Publication year - 1990
Publication title -
crop science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.76
H-Index - 147
eISSN - 1435-0653
pISSN - 0011-183X
DOI - 10.2135/cropsci1990.0011183x003000020037x
Subject(s) - biology , yield (engineering) , selection (genetic algorithm) , breeding program , cultivar , agronomy , glycine , microbiology and biotechnology , genetics , computer science , materials science , artificial intelligence , metallurgy , amino acid
An early generation testing program to identify crosses with superior yield potential and F 2 plants within these crosses which receive a superior complement of yield genes would be useful in soybean [ Glycine max (L.) Merr.] breeding. Early generation testing is effective in identifying superior yielding pure lines, but requires extra yield testing. This paper describes a modified early generation testing procedure where the number of yield test plots required per cross has been reduced from 1860 to 175 plots, allowing a 10‐fold increase in the number of crosses that are evaluated per year. This was accomplished by reducing the number of F 2 ‐derived lines per cross from 300 to 30 and by using single location, single replication data as a basis for selection in F 2.3 through F 2.4.6 . This modified early generation testing procedure has been used in a soybean breeding program since 1972, resulting in the release of eight high‐yielding soybean cultivars.