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Genetics of Host Plant Resistance of Wheat to Septoria nodorum 1
Author(s) -
Nelson L. R.,
Gates C. E.
Publication year - 1982
Publication title -
crop science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.76
H-Index - 147
eISSN - 1435-0653
pISSN - 0011-183X
DOI - 10.2135/cropsci1982.0011183x002200040017x
Subject(s) - septoria , biology , diallel cross , cultivar , glume , heterosis , plant disease resistance , horticulture , agronomy , botany , genetics , gene , hybrid
F 1 progeny from diallel crosses (reciprocals included) among five wheat ( Triticum aestivum L.) cultivars were tested in the greenhouse for reaction to infection by Leptosphaeria nodorum Muller [imperfect stage = Septoria nodorum (Berk.) Berk.], the cause of glume blotch. In a separate experiment, four wheat parents and all F 1 , F 2 , and backcrosses were likewise tested for reaction to the pathogen. Significant effects were found for additive, dominance, and additive ✕ additive genetic effects as well as heterosis. Cultivars with the additive type resistance were ‘Oasis’ and ‘Blueboy II’ in Exp. I and Oasis in Exp. II. Crosses involving ‘McNair 1813’, a susceptible parent, demonstrated heterosis for a more resistant reaction. These results indicate that resistance to S. nodorum is inherited in a very complex manner and that several genes may be involved.