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Grain Yield Variations in Oats Associated with Differences in Leaf Area Duration Among Oat Lines 1
Author(s) -
Helsel Diana Bloethe,
Frey Kenneth J.
Publication year - 1978
Publication title -
crop science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.76
H-Index - 147
eISSN - 1435-0653
pISSN - 0011-183X
DOI - 10.2135/cropsci1978.0011183x001800050018x
Subject(s) - biology , panicle , avena , germplasm , cultivar , agronomy , introgression , poaceae , yield (engineering) , grain yield , glume , inflorescence , horticulture , biochemistry , materials science , metallurgy , gene
Growth and yield component analyses were used to attempt to define the source of grain yield increases (27 to 30% above the cultivar ‘Clintford’) found in oat ( Avena sativa L.) lines developed through introgression of Avena sterilis L. germplasm into the Clintford background. Leaf area and leaf area duration were found to be the two traits that could account for the higher yielding ability of the derived lines. By developing a larger leaf‐blade area and delaying senescence, the cultivars had the potential to produce more photosynthate than Clintford. Early development of greater leaf‐blade area probably caused the initiation of a larger number of spikelets per panicle, and the maintenance of a large photosynthetically active system longer after flowering could have caused the development of larger kernels. Higher yield of the derived lines was due to more spikelets per panicle and increased kernel weight. Apparently, the A. sterilis germplasm contributed genes for enhanced leaf growth and delayed senescence which, inserted into the Clintford background, resulted in lines with higher grain yields.