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A Path Coefficient Analysis of Some Yield Component Interrelations in Field Beans ( Phaseolus vulgaris L.) 1
Author(s) -
Duarte Rodrigo A.,
Adams M. W.
Publication year - 1972
Publication title -
crop science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.76
H-Index - 147
eISSN - 1435-0653
pISSN - 0011-183X
DOI - 10.2135/cropsci1972.0011183x001200050009x
Subject(s) - point of delivery , biology , phaseolus , plant stem , path coefficient , main stem , path analysis (statistics) , selection (genetic algorithm) , yield (engineering) , botany , horticulture , agronomy , statistics , mathematics , materials science , artificial intelligence , computer science , metallurgy
A path‐coefficient analysis was performed in field beans of the direct and indirect effects of leaf number and leaf size upon number of pods per plant, number of seeds per pod, and seed weight, and of the latter components upon yield. The data on which the analysis was based were obtained from F 3 and F 4 families in a recurrent selection experiment grown at three locations. Selection had been practiced for each component separately, at three levels of expression (high, modal, low), in sub‐populations maintained at each of the three locations. The chief findings were: 1) Pods/plants exerts a preponderant effect upon yield in every set of families studied. 2)In families where selection had produced divergent types with respect to seed number per pod, and seed weight, these components also assumed major roles in determining yield. 3) Leaf number was highly associated with pod number per plant and leaf size was highly associated with seed size in families selected for high, modal, and low levels of expression of the two leaf area components. Interpretations of these findings are given, based first on a common genetic program regulating the number of main stem internodes, and secondly on another genetic program regulating leaf cell number and/or rate of expansion. The rationale connecting these fundamental characteristics with the first‐ and second‐order yield components is given.