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Heterosis, Inbreeding Depression, and Heritability Estimates in a Systematic Series of Grain Sorghum Genotypes 1
Author(s) -
Liang G. H.,
Reddy C. R.,
Dayton A. D.
Publication year - 1972
Publication title -
crop science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.76
H-Index - 147
eISSN - 1435-0653
pISSN - 0011-183X
DOI - 10.2135/cropsci1972.0011183x001200040003x
Subject(s) - heterosis , inbreeding depression , heritability , biology , sorghum , epistasis , inbreeding , grain yield , genetic variability , agronomy , genotype , genetics , hybrid , demography , gene , population , sociology
Ten genetic sets of grain sorghum ( Sorghum bicolor L. Moench) each consisting of two pure lines, their F 1 , F 2 , and first backcrosses were studied at two locations in two years. Of characteristics observed, grain yield showed the highest heterosis [(F 1 —better parent)(100)/better parent] as averaged over the 10 sets and likewise had the greatest inbreeding depression [(F 1 —F 2 ) (100)/F 1 ]. Heterosis was low for plant height and negative for days‐to‐first‐bloom and kernel weight. Narrow sense heritability estimates, for the F 2 generation, varied among sets. The estimates for days‐to‐first‐bloom, plant height, and kernel weight were relatively high. In contrast, grain yield had low heritability. Expected genetic advance in F 3 yield under selection, was higher than actual advance for most sets, suggesting epistasis.