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Yield Component Heritabilities and Interrelationships in Winter Wheat ( Triticum aestivum L.) 1
Author(s) -
Fonseca Santiago,
Patterson Fred L.
Publication year - 1968
Publication title -
crop science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.76
H-Index - 147
eISSN - 1435-0653
pISSN - 0011-183X
DOI - 10.2135/cropsci1968.0011183x000800050032x
Subject(s) - diallel cross , heritability , path coefficient , biology , path analysis (statistics) , yield (engineering) , grain yield , mathematics , agronomy , statistics , hybrid , materials science , genetics , metallurgy
A seven‐parent diallel cross of winter wheat was grown in the F 1 generation in hills for 2 years and in the F 2 generation in hills and in nursery yield plots the second year. Heritability estimates for earliness of flowering, height, number of spikes, kernels per spike, kernel weight, and grain yield were obtained from regression of F 1 or F 2 means on mid‐parent values. Simple correlations were calculated among all variables. The correlations were analyzed further by the path coefficient technique to determine direct and indirect effects. Heritability estimates from data from hills for earliness, height, number of spikes, and kernels per head were high and those for kernel weight and grain yield were intermediate or low. Estimates in the F 1 and F 2 generations from data obtained from hill plots were reasonably similar. Estimates of heritabilities for the six characters from the F 2 generation, were very similar for hills and thick‐seeded nurseries. The three components of yield were highly correlated with grain yield. The path‐coefficient analysis indicated that each of the components had large direct effects on grain yield but important indirect effects resulting from negative correlations among yield components.