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A Positive Regression of Yield on Maturity in Sorghum 1
Author(s) -
Dalton L. G.
Publication year - 1967
Publication title -
crop science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.76
H-Index - 147
eISSN - 1435-0653
pISSN - 0011-183X
DOI - 10.2135/cropsci1967.0011183x000700030035x
Subject(s) - sorghum , maturity (psychological) , biology , hybrid , yield (engineering) , regression analysis , regression , agronomy , linear regression , statistics , mathematics , psychology , developmental psychology , materials science , metallurgy
A positive regression between high yields and late maturity is demonstrated for grain sorghum. This regression should be considered when hybrid performance is tested. The use of this high yield‐late maturity relationship should assist in the detection of the more productive hybrids at all levels of maturity.