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Effect of Leaf Removal on the Grain Yield of Wheat and Oats 1
Author(s) -
Womack David,
Thurman R. L.
Publication year - 1962
Publication title -
crop science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.76
H-Index - 147
eISSN - 1435-0653
pISSN - 0011-183X
DOI - 10.2135/cropsci1962.0011183x000200050019x
Subject(s) - citation , library science , grain yield , yield (engineering) , horticulture , biology , computer science , physics , thermodynamics
T EAP area may be damaged or partly removed by deficient •*-* soil moisture, normal deterioration with maturity, insects, diseases, and other causes (hail, etc.). Irrigation, fertilization, and other cultural practices often greatly affect the amount of leaf area developed, the amount lost, and the efficiency of the area remaining. It is of interest to a plant breeder to be able to measure the actual inherited grain yield of a crop and the effects of other factors upon yield. It is desirable to know the amount of leaf area removal required to reduce yields and the stage in the development of the plant at which this is most critical.

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