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Active Sensor Reflectance Measurements of Corn Nitrogen Status and Yield Potential
Author(s) -
Solari Fernando,
Shanahan John,
Ferguson Richard,
Schepers James,
Gitelson Anatoly
Publication year - 2008
Publication title -
agronomy journal
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.752
H-Index - 131
eISSN - 1435-0645
pISSN - 0002-1962
DOI - 10.2134/agronj2007.0244
Subject(s) - normalized difference vegetation index , canopy , reflectivity , yield (engineering) , crop , agronomy , chlorophyll , leaf area index , nitrogen , environmental science , vegetation (pathology) , remote sensing , zoology , mathematics , horticulture , chemistry , biology , botany , materials science , geography , optics , medicine , physics , organic chemistry , pathology , metallurgy
Active sensor reflectance assessments of corn ( Zea mays L.) canopy N status are advocated to direct variable N applications and improve N use efficiency (NUE). Our goals were to determine: (i) growth stage and (ii) sensor vegetation index with greatest sensitivity in assessing N status and grain yield. Variable crop N was generated by supplying N at different amounts and times in three field studies. Chlorophyll meter (CM) and sensor data were gathered at two vegetative (V11 and V15) and two reproductive (R1 and R3) growth stages, using the Crop Circle sensor that measures reflectance in visible (590 nm) and near infrared (NIR) (880 nm) bands. Sensor data were converted to the normalized difference vegetation index (NDVI 590 ) and chlorophyll index (CI 590 ) values. Grain yields were also determined. Sensor indices were more highly correlated with CM readings for vegetative vs. reproductive growth ( r 2 of 0.85 vs. 0.55). The CM vs. CI 590 slope was over twice the NDVI 590 slope value, indicating CI 590 was more sensitive than NDVI 590 in assessing canopy greenness. Indices did not differ in ability to distinguish yield variation. Results indicate sensor CI 590 values collected during vegetative growth are best suited to direct variable N applications.