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Light Reflectance Compared with Other Nitrogen Stress Measurements in Corn Leaves
Author(s) -
Blackmer Tracy M.,
Schepers James S.,
Varvel Gary E.
Publication year - 1994
Publication title -
agronomy journal
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.752
H-Index - 131
eISSN - 1435-0645
pISSN - 0002-1962
DOI - 10.2134/agronj1994.00021962008600060002x
Subject(s) - reflectivity , colorimeter , chlorophyll , nitrogen , zea mays , fertilizer , chemistry , agronomy , horticulture , biology , optics , physics , organic chemistry
New tools that can rapidly quantify the N status of corn could be valuable in N fertilizer management practices. This study was conducted to compare light reflectance from corn leaves with other parameters used to detect N deficiencies. Light reflectance (400–700 nm) as measured from corn leaves in the laboratory with a Hunter tristimulus colorimeter was compared with Minolta SPAD 502 chlorophyll meter readings (light transmittance at 650 and 940 nm), leaf N concentrations, and specific leaf N (N content per unit area). Measurements were made on individual ear leaves collected from an irrigated corn N response trial with four hybrids and five N treatments. Light reflectance near 550 nm was the best wavelength to separate N treatment differences. Reflectance at 550 nm provided a stronger relationship with both leaf N concentration and chlorophyll meter readings than between chlorophyll meter readings and leaf N concentration. The measurement of light reflectance near 550 nm has promise as a technique to detect N deficiencies in corn leaves.