Open AccessAlgorithm for automated visual inspection of monolithic integrated circuits using neural networks
Author(s) -
Boris Shiryaev,
А. Yu. Yushchenko,
A. V. Bezruk
Publication year - 2019
Publication title -
doklady tomskogo gosudarstvennogo universiteta sistem upravleniâ i radioèlektroniki
Language(s) - English
Resource type - Journals
ISSN - 1818-0442
DOI - 10.21293/1818-0442-2019-22-2-72-76
Subject(s) - computer science , visual inspection , integrated circuit , artificial neural network , electronic circuit , computer hardware , biological neural network , artificial intelligence , embedded system , computer vision , engineering , electrical engineering , machine learning , operating system