Open AccessEstimating of the influence of defectiveness level of the enameled wires on reliability of interturn insulation
Author(s) -
A.N. Dudkin,
Andrey Leonov,
Adelya Supueva
Publication year - 2017
Publication title -
doklady tomskogo gosudarstvennogo universiteta sistem upravleniâ i radioèlektroniki
Language(s) - English
Resource type - Journals
ISSN - 1818-0442
DOI - 10.21293/1818-0442-2017-20-2-123-126
Subject(s) - reliability (semiconductor) , reliability engineering , forensic engineering , materials science , structural engineering , engineering , physics , power (physics) , quantum mechanics