Open AccessComparison of Depth Profiles of CIGS Thin Film by Micro-Raman and XPS
Author(s) -
Gun Yeol Beak,
ChanWook Jeon
Publication year - 2016
Publication title -
current photovoltaic research
Language(s) - English
Resource type - Journals
eISSN - 2508-125X
pISSN - 2288-3274
DOI - 10.21218/cpr.2016.4.1.021
Subject(s) - raman spectroscopy , copper indium gallium selenide solar cells , chalcopyrite , x ray photoelectron spectroscopy , thin film , materials science , analytical chemistry (journal) , sputtering , diffraction , optics , chemistry , nanotechnology , chemical engineering , metallurgy , copper , physics , engineering , chromatography
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