Open AccessIsochronal Studies of the Structural and Electrical Properties of CdTe Films
Author(s) -
Baghdad Science Journal
Publication year - 2011
Publication title -
mağallaẗ baġdād li-l-ʿulūm
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.167
H-Index - 6
eISSN - 2411-7986
pISSN - 2078-8665
DOI - 10.21123/bsj.8.1.134-140
Subject(s) - annealing (glass) , cadmium telluride photovoltaics , materials science , electrical resistivity and conductivity , vacuum evaporation , hall effect , diffraction , thin film , analytical chemistry (journal) , optoelectronics , composite material , optics , nanotechnology , chemistry , electrical engineering , physics , chromatography , engineering
The paper reports the influence of annealing temperature under vacuum for one hour on the some structural and electrical properties of p-type CdTe thin films were grown at room temperature under high vacuum by using thermal evaporation technique with a mean thickness about 600nm. X-ray diffraction analysis confirms the formation of CdTe cubic phase at all annealing temperature. From investigated the electrical properties of CdTe thin films, the electrical conductivity, the majority carrier concentration, and the Hall mobility were found increase with increasing annealing temperatures.