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Best estimation for the Reliability of 2-parameter Weibull Distribution
Author(s) -
Sadeq M. Jaafar,
Baydaa Ismael Abdulwahhab,
Intasar A. Hasson
Publication year - 2009
Publication title -
mağallaẗ baġdād li-l-ʿulūm
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.167
H-Index - 6
eISSN - 2411-7986
pISSN - 2078-8665
DOI - 10.21123/bsj.6.4.705-710
Subject(s) - weibull distribution , statistics , mathematics , reliability (semiconductor) , maximum likelihood , mean squared error , sample size determination , power (physics) , physics , quantum mechanics
This Research Tries To Investigate The Problem Of Estimating The Reliability Of Two Parameter Weibull Distribution,By Using Maximum Likelihood Method, And White Method. The Comparison Is done Through Simulation Process Depending On Three Choices Of Models (?=0.8 , ß=0.9) , (?=1.2 , ß=1.5) and (?=2.5 , ß=2).And Sample Size n=10 , 70, 150 We Use the Statistical Criterion Based On the Mean Square Error (MSE) For Comparison Amongst The Methods.

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