Open AccessStudy of Nonlinear Refraction and Nonlinear Absorption Coefficients of Different CdS Film Thickness by diode laser
Author(s) -
Baghdad Science Journal
Publication year - 2013
Publication title -
mağallaẗ baġdād li-l-ʿulūm
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.167
H-Index - 6
eISSN - 2411-7986
pISSN - 2078-8665
DOI - 10.21123/bsj.10.1.217-225
Subject(s) - materials science , optics , refractive index , absorption (acoustics) , michelson interferometer , attenuation coefficient , laser , refraction , z scan technique , wavelength , two photon absorption , diode , interferometry , nonlinear system , optoelectronics , laser diode , tunable diode laser absorption spectroscopy , nonlinear optics , tunable laser , physics , quantum mechanics
In the present work, different thicknesses of CdS film were prepared by chemical bath deposition. Z-Scan technique was used to study the nonlinear refractive index and nonlinear absorption coefficients. Linear optical testing were done such as transmission test, and thickness of films were done by the interference fringes (Michelson interferometer). Z-scan experiment was performed at 650nm using CW diode laser and at 532nm wavelength. The results show the effect of self-focusing and defocusing that corresponds with nonlinear refraction n2. The effect of two-photon absorption was also studied, which correspond to the nonlinear absorption coefficient B.