Open AccessMethod of Using radio-electronic Equipment Diagnostics Durable Systems and Devices for Localization of Defective Elements
Author(s) -
Odinakhon Satvoldiyevna Olimova
Publication year - 2022
Publication title -
academia open
Language(s) - English
Resource type - Journals
ISSN - 2714-7444
DOI - 10.21070/acopen.7.2022.4721
Subject(s) - downtime , maintainability , reliability engineering , reliability (semiconductor) , fault (geology) , computer science , fault detection and isolation , fault tolerance , electronic systems , embedded system , engineering , electronic engineering , artificial intelligence , power (physics) , physics , actuator , quantum mechanics , seismology , geology
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