
Application of wavelet-analysis for image filtration in electronic and probe microscopy
Author(s) -
Nikolai P. Konnov,
Yu. P. Volkov,
М. Н. Киреев,
О. С. Кузнецов
Publication year - 2008
Publication title -
problemy osobo opasnyh infekcij
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.16
H-Index - 3
eISSN - 2658-719X
pISSN - 0370-1069
DOI - 10.21055/0370-1069-2008-3(97)-60-63
Subject(s) - wavelet , filtration (mathematics) , microscopy , noise (video) , artificial intelligence , resolution (logic) , image (mathematics) , object (grammar) , computer vision , materials science , computer science , pattern recognition (psychology) , optics , mathematics , physics , statistics
The review presents the results of application of the programs of discrete and stationary wavelet-analysis for filtration of object image from noise and for the increase of its resolution capability in electronic and probe microscopy.