z-logo
open-access-imgOpen Access
The Development, Validity, and Reliability of Behavior Rating Scale for Elementary Students
Author(s) -
A Young Kim,
유현실,
Kang Eun Young,
김의정
Publication year - 2018
Publication title -
korean journal of physical multiple and health disabilities
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.186
H-Index - 4
eISSN - 2713-6795
pISSN - 2288-3843
DOI - 10.20971/kcpmd.2018.61.1.339
Subject(s) - rating scale , psychology , reliability (semiconductor) , scale (ratio) , validity , test validity , reliability engineering , applied psychology , psychometrics , clinical psychology , developmental psychology , engineering , geography , physics , cartography , power (physics) , quantum mechanics

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom