Open AccessThe Development, Validity, and Reliability of Behavior Rating Scale for Elementary Students
Author(s) -
Ae-Hwa Kim,
kimuijung,
Yoo Hyun Sil,
Eun-Young Kang
Publication year - 2018
Publication title -
jiche jungbok geon-gang jang-ae yeon-gu/jiche.jungbok.geongang jangae yeongu
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.186
H-Index - 4
eISSN - 2713-6795
pISSN - 2288-3843
DOI - 10.20971/kcpmd.2018.61.1.339
Subject(s) - rating scale , psychology , reliability (semiconductor) , scale (ratio) , validity , test validity , reliability engineering , applied psychology , psychometrics , clinical psychology , developmental psychology , engineering , geography , physics , cartography , power (physics) , quantum mechanics