Open AccessShort single tests for logic networks under arbitrary stuck-at faults at outputs of gates
Author(s) -
Кирилл Андреевич Попков
Publication year - 2018
Publication title -
keldysh institute preprints
Language(s) - English
Resource type - Journals
eISSN - 2071-2901
pISSN - 2071-2898
DOI - 10.20948/prepr-2018-33
Subject(s) - computer science , arithmetic , reliability engineering , algorithm , mathematics , engineering
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