Open AccessLower bounds on lengths of single tests for logic circuits
Author(s) -
Кирилл Андреевич Попков
Publication year - 2016
Publication title -
preprint/preprinty ipm im. m.v. keldyša
Language(s) - English
Resource type - Journals
eISSN - 2071-2901
pISSN - 2071-2898
DOI - 10.20948/prepr-2016-139
Subject(s) - mathematics , electronic circuit , algorithm , computer science , engineering , electrical engineering