Open AccessApproach to building inspection tests of digital devices on extra large integrated circuits
Author(s) -
Vasyl Kulikov
Publication year - 2012
Publication title -
information technology and security
Language(s) - English
Resource type - Journals
eISSN - 2518-1033
pISSN - 2411-1031
DOI - 10.20535/2411-1031.2012.1.1.53673
Subject(s) - very large scale integration , computer science , digital electronics , process (computing) , electronic circuit , computer engineering , combinational logic , tree (set theory) , terminal (telecommunication) , integrated circuit , fault coverage , reliability engineering , algorithm , embedded system , logic gate , engineering , mathematics , electrical engineering , mathematical analysis , telecommunications , operating system