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RELIABILITY OF THIN SHELLS WITH REAL SHAPE IMPERFECTIONS
Author(s) -
Olga Lukіanchenko,
Yurii Vorona,
Олена Костіна,
Maksim Vabishevich,
O M Paliy
Publication year - 2019
Publication title -
vìsnik kiïvsʹkogo polìtehnìčnogo ìnstitutu. serìâ priladobuduvannâ/vìsnik kiïvsʹkogo polìtehnìčnogo ìnstitutu. serìâ priladobuduvannâ
Language(s) - English
Resource type - Journals
eISSN - 2663-3450
pISSN - 0321-2211
DOI - 10.20535/1970.58(2).2019.189473
Subject(s) - reliability (semiconductor) , probabilistic logic , nonlinear system , structural engineering , reliability engineering , engineering , boundary value problem , boundary (topology) , stability (learning theory) , probability density function , computer science , mathematics , mathematical analysis , power (physics) , statistics , physics , quantum mechanics , artificial intelligence , machine learning