Open AccessFailure Oriented Accelerated Testing (FOAT), Boltzmann Arrhenius Zhurkov Equation (BAZ), and their Application in Aerospace Microelectronics and Photonics Reliability Engineering
Author(s) -
Ephraïm Suhir
Publication year - 2019
Publication title -
international journal of aeronautical science and aerospace research
Language(s) - English
Resource type - Journals
ISSN - 2470-4415
DOI - 10.19070/2470-4415-1900022
Subject(s) - aerospace , reliability (semiconductor) , microelectronics , arrhenius equation , photonics , accelerated life testing , reliability engineering , physics of failure , boltzmann constant , boltzmann equation , engineering , materials science , engineering physics , aerospace engineering , computer science , physics , thermodynamics , electrical engineering , optoelectronics , classical mechanics , mathematics , power (physics) , statistics , weibull distribution , kinetics