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Discharge diagnosis of high Xe concentration and high‐γ protective layer in PDPs
Author(s) -
Zhu Di,
Zhang Xiong,
Izumi Tomoaki,
Akiyama Toshiyuki,
Kajiyama Hiroshi
Publication year - 2012
Publication title -
journal of the society for information display
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.578
H-Index - 52
eISSN - 1938-3657
pISSN - 1071-0922
DOI - 10.1889/jsid20.2.109
Subject(s) - luminous efficacy , materials science , xenon , excimer , atomic physics , excitation , luminance , layer (electronics) , electron , optoelectronics , radiation , high voltage , analytical chemistry (journal) , optics , voltage , chemistry , fluorescence , nanotechnology , physics , quantum mechanics , chromatography
— The high‐Xe‐concentration and high‐γ (ion‐induced secondary‐electron emission coefficient) protective layer have been diagnosed from both experimentation and simulation. The experimental results show that there is a great increase in luminance and luminous efficacy, while the breakdown voltage decreases in the high‐Xe and high‐γ discharge. In the high‐Xe discharge, the great increase in VUV radiation mainly results from an increase in excimer VUV emission. The application of high‐Xe concentration can greatly increase the luminous efficacy, while the high‐γ protective layer can promote it further. Considering that the total discharge efficiency can be divided into the electron heating efficiency, the Xe excitation efficiency, and the VUV radiation efficiency, both the electron heating efficiency and Xe excitation efficiency increased for a high‐Xe discharge; while for a high‐γ discharge, the increase in electron heating efficiency contributes to the improvement in discharge efficiency.