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Detailed analysis of exciton decay time change in organic light‐emitting devices caused by optical effects
Author(s) -
Mladenovski Saso,
Penninck Lieven,
Neyts Kristiaan,
Reineke Sebastian
Publication year - 2011
Publication title -
journal of the society for information display
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.578
H-Index - 52
eISSN - 1938-3657
pISSN - 1071-0922
DOI - 10.1889/jsid19.1.80
Subject(s) - exciton , oled , radiative transfer , optoelectronics , materials science , physics , layer (electronics) , atomic physics , optics , condensed matter physics , nanotechnology
— The exciton decay time in organic light‐emitting devices (OLEDs) depends on the optical environment, i.e. , the thicknesses and refractive indices of all layers in a device. The decay of an exciton can occur through a radiative or a non‐radiative channel. Each of these channels has a probability, which is expressed by, respectively, the radiative and the non‐radiative decay rate. The radiative decay rate is influenced by the optical environment, i.e. , the OLED's thin‐film layer structure. In this paper, a model for estimating the change of the exciton decay time (inverse of the decay rate) is presented. In addition, the decay time change in both top‐ and bottom‐emitting OLEDs as a function of the charge‐transport layer thicknesses has been investigated. Furthermore, the most important mechanism responsible for the exciton decay time change is outlined.