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Performance of the efficacy enhancement layer using nano‐particles in PDPs
Author(s) -
Nagano Shinichiro,
Jang SangHun,
Kang JaeWook,
Yu YongMi,
Lee ChunGyoo
Publication year - 2010
Publication title -
journal of the society for information display
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.578
H-Index - 52
eISSN - 1938-3657
pISSN - 1071-0922
DOI - 10.1889/jsid18.12.1095
Subject(s) - materials science , luminous efficacy , layer (electronics) , capacitance , optoelectronics , dielectric , surface roughness , particle (ecology) , nano , surface finish , particle size , nanotechnology , indium tin oxide , layer by layer , threshold voltage , composite material , voltage , electrical engineering , chemical engineering , electrode , chemistry , oceanography , transistor , geology , engineering
— A nano‐particle dielectric layer was experimentally placed between a conventional dielectric layer and a MgO thin film. This greatly reduces the discharge current and enhances high luminous efficacy. The current reduction might reflect a capacitance reduction in the entire dielectric layer due to the extremely low permittivity of the nano‐particle layer which includes a large amount of space. The luminous efficacy is improved more than what is expected because of the reduction in capacitance. The layer affects the MgO film properties such as crystal growth size, orientation, cathode luminescence, and exo‐electron emission. As a result, it improves the statistical delay in addressing. This might be caused by the large crystal growth of MgO due to the surface roughness of the nano‐particle layer underneath. The particle size required to optimize the roughness of the large growth is about 10–50 nm. The rise in the discharge voltage accompanied by the nano‐particle layer insertion is improved when the layer is properly patterned. A reduction in luminance is prevented when it is patterned in narrow lines along the X — Y gaps while the improvement in address delay strongly depends on the areal ratio of the nano‐particle layer.